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107JPC precision measuring microscope
107JPC precision measuring microscope
Product details

Instrument features:
This instrument uses a metal grating ruler and reading head from the British company RENISHAW, and is equipped with a computer image processing system. Using a camera to directly aim on a computer screen is easy to operate and highly reliable. The contour of the measured workpiece can be directly displayed on the computer screen through computer interfaces and two-dimensional measurement programs, and can be edited by AUTOCAD. The two-dimensional measurement program includes measurement functions such as point, line, circle, arc, straightness, roundness, thread, cam, etc. This instrument has a high magnification factor. In addition to moving the X and Y coordinates, the worktable can also rotate 360 ° and measure the Z coordinate in the height direction. In addition to providing transparent and reflective lighting, the lighting system can also provide oblique lighting.Main technical specifications
Lens barrel | coarse motion | Adjustment range: 90mm | |
jogging | Adjustment range 2mm | ||
High (Z) measurement Z- | 1mm minimum reading 0.001mm | ||
Lens barrel | Binocular tube with a downward angle of 45 ° | ||
workbenches | Left and right X-axis | moving range | |
Front and rear Y-axis | moving range | ||
resolution | 0.5μm | ||
rotate | 360° | ||
Lighting System | light source | Transmission lighting | 8V, 12W blue and green color filters |
Reflective lighting | 8V, 12W frosted light bulb, green filter | ||
Oblique lighting | 8V,12W | ||
power supply | AC220±10%,50/60HZ | ||
optical system | eyepiece | BWF 10X | |
objective | 4X, working distance 17.5, focal length 28.8 | ||
10X, working distance 11.6 focal length | |||
40X, working distance 0.66, focal length 4.4 |
Purpose:
The 107JPC intelligent two-dimensional precision measurement microscope uses transmission and reflection methods to accurately measure the length and angle of workpieces. Specially suitable for testing magnetic heads, magnetic cards, line widths of large-scale integrated circuits, and other precision components. Widely applicable to metrology rooms, production lines, and scientific research departments.
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